|
|
Lab Tour
Welcome to the Lab Tour at the Inorganic Materials and Ceramics Research Group. In this section we will guide you through some of the most
important instruments we use in our research.
Synthesis laboratories
Powder and nano-particle synthesis laboratory equipped with i.e. spray pyrolysis (see picture on the right) , rotavapors, ultrasound disintegrator, centrifuges and vacuum lines.
Laboratory equipped with a wide variety of furnaces also equipped with thermobalances;
Chamber furnaces up to max 1600°C
Tube furnaces up to max 1500°C
Graphite resistance furnaces up to 2300°C (inert/reducing atmosphere)
SiC furnace up to 1450°C.

Powder processing laboratory with crushing and milling equipment i.e. ball mill, attrition mill, satelite mill.
Pressing equipment including uniaxial pressing and CIP.
Sol-gel synthesis (see picture on the left) and wet chemistry synthesis laboratory with necessary equipment.
NTNU Nanolab: Laboratory for synthesis with chemical methods located in the same building
Characterization laboratories
Bruker D8 ADVANCE X-ray diffractometer
Cu Ka X-ray tube, variable divergence slit assembly
Theta/theta base goniometer, automatic sample changer, rotating reflection sample stage.
Variable antiscatter slit assembly, scintillation detector.
VENTEC-I 1D detector with large active area.
TC-Wide Range low/high temperature chamber, rotating ceramic sample stage.
Siemens D5005 powder X-ray diffractometer
Primary monochromator (quartz)
Cu Ka X-ray tube
Automatic antiscatter slitt
Scintillation detector
Siemens D5005 powder X-ray diffractometer
Secondary monochromator (graphite)
Automatic antiscatter and divergence slitt
Göbel mirror system
High temperature system HTK 15
Pos. sensitive and scintillation detector
Grazing incidence attachment
Sample changer 40 pos.
Capilary sample holder
Hitatchi 3500 Electron microscope with Oxford EDS System
Variable pressure
3.0 nm resolution at 25kV
0.3-30 kV Acceleration voltage range
Dual-Bias for superior low voltage signal-noise
PCI data management interface
Bruker IFS 66v Fourier Transform Infrared (FT-IR) Spectrometer
4500-100 cm-1
Attached IR microscope
Cary 5, UV-VIS-NIR Spectrometer
57000 - 333 cm-1
Mastersizer 2000 Particle Analyzer
Measurement of materials in a single size range from 0.02 to 2000 µm
Micrometrics TRISTAR 3000
Measurement of surface area, pore size and pore volume by N2-absorbation
Porediameter 3.5-2100 Å
Mechanical characterization of gels
Mechanical 3-point bending of gels
100g load cell
Mechanical characterization of ceramic materials
Equipment for testing of mechanical properties of ceramics has been constructed in cooperation with SINTEF Materials Technology. The equipment is constructed to measure:
Stress-strain behavior in 4-point bending or compression
4 point bending strength
Fracture toughness
E-modulus and
Creep resistance
up to 1100°C and under controlled atmosphere (inert or controlled partial pressure of oxygen).
Netzsch STA 449 C (Jupiter), Combined TG/DSC-Instrument
Temperature range: RT-1650°C
Controlled atmosphere: Oxidizing, reducing, inert and vacuum.
Max. sample weight: 5g
Resolution: 1mg
Drift <1mg/h
Netzsch DIL 402 C, Dilatometer
Temperature range: RT-1600°C
Measurement ranges: 50/500/5000 mm
Sensitivity: 1.25/12.5/125 nm/digit
Sample dimensions (max.): 25 mm long, 8 mm diameter (rod)
Sample atmosphere: Vacuum 10-4mbar, static, dynamic inert or oxidising.
Netzsch DIL 402 C/7, High temp. Dilatometer
Temperature range: RT-2000°C
Measurement ranges: 50/500/5000 mm
Sensitivity: 1.25/12.5/125 nm/digit
Sample dimensions (max.): 25 mm long, 8 mm diameter (rod)
Sample atmosphere: Inert, reducing and vacuum 10-4mbar. Oxidising (max. 1680°C,using an alumina protective tube).
|